A Simplified Analytical Technique for High Frequency Characterization of Resonant Tunneling Diode

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A Simplified Analytical Technique for High Frequency Characterization of Resonant Tunneling Diode

87 Abstract—This paper proposes a simplified analytical technique for high frequency characterization of the resonant tunneling diode (RTD). An equivalent circuit of the RTD that consists of a parallel combination of conductance, G (V, f), and capacitance, C (V, f) is formulated. The proposed approach uses the measured DC current versus voltage characteristic of the RTD to extract the equivalen...

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Article history: Received 16 May 2012 Received in revised form 20 October 2012 Accepted 11 December 2012 Available online 22 December 2012

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ژورنال

عنوان ژورنال: Advances in Electrical and Computer Engineering

سال: 2014

ISSN: 1582-7445,1844-7600

DOI: 10.4316/aece.2014.04013